Sigmund, J., Saglam, M., Vogt, A., Hartnagel, H., Buschmann, V., Wieder, T. & Fuess, H. (2000). Microstructure analysis of ohmic contacts on MBE grown n-GaSb and investigation of sub-micron contacts. Journal of Crystal Growth, 227--228, 625--629. doi: 10.1016/S0022-0248801900785-0