@article{ThomasWieder2001b,
  author = {Sigmund, J. and Saglam, M. and Vogt, A. and Hartnagel, H.L. and Buschmann, V. and Wieder, T. and Fuess, H.},
  doi = {10.1016/S0022-0248\%2801\%2900785-0},
  interhash = {890bf2070a3dac3fed48873fbded9fd8},
  intrahash = {c9df2e01627995b5c2ecdbbb4c734c75},
  journal = {Journal of Crystal Growth},
  pages = {625--629},
  title = {Microstructure analysis of ohmic contacts on {MBE} grown {n-GaSb} and investigation of sub-micron contacts},
  volume = {227--228},
  year = 2000
}