@article{ThomasWieder2002b,
  author = {Njeh, A. and Wieder, T. and Fuess, H.},
  doi = {10.1002/sia.1421},
  interhash = {7822edc276c993f6ced934050f6e64eb},
  intrahash = {6822db6cc2eb623552a3a8fa5ba41fdd},
  journal = {Surface and Interface Analysis},
  pages = {626--628},
  title = {Reflectometry studies of the oxidation kinetics of thin copper films},
  volume = 33,
  year = 2002
}