Ehresmann, A. ; Krug, I. ; Kronenberger, A. ; Ehlers, A. ; Engel, D.:
In-plane magnetic pattern separation in NiFe/NiO and Co/NiO exchange biased bilayers investigated by magnetic force microscopy.
In: Journal of Magnetism and Magnetic Materials,
280
(2004),
Nr. 2-3,
S. 369 - 376