%0 Book
%1 otwin2010lockin
%A Breitenstein, Otwin.
%A Warta, Wilhelm.
%A Langenkamp, Martin.
%C Berlin, Heidelberg
%D 2010
%I Springer-Verlag Berlin Heidelberg
%K Thermography
%P --
%T Lock-in Thermography Basics and Use for Evaluating Electronic Devices and Materials
%U http://dx.doi.org/10.1007/978-3-642-02417-7