@book{otwin2010lockin,
  address = {Berlin, Heidelberg},
  author = {Breitenstein, Otwin. and Warta, Wilhelm. and Langenkamp, Martin.},
  interhash = {405ae4ce6307f0050ad3b7bba658a432},
  intrahash = {541dc8139498c3c1e0405012ac66c657},
  isbn = {9783642024177 3642024173 9783642024160 3642024165},
  pages = {--},
  publisher = {Springer-Verlag Berlin Heidelberg},
  refid = {682060183},
  title = {Lock-in Thermography Basics and Use for Evaluating Electronic Devices and Materials},
  url = {http://dx.doi.org/10.1007/978-3-642-02417-7},
  year = 2010
}